TECHNOFOUR

Defectoscope-EX

Defectoscope-EX

Defectoscope-EX

Defectoscope Test System

Advanced rotating component eddy current system for detection of fine cracks on roto-symmetrical automotive and other precision components

Overview

Technofour Defectoscope-EX Test System detects surface-breaking cracks on finished roto-symmetrical components such as ball pins, gudgeon pins, piston rods, bearing races, rollers, cylinder liners, gear blanks, ammunition shells etc in production environment or at inward quality inspection.

The component is rotated while one or more probes scan the surface helically. Either the component advances past stationary probes as it rotates, or the probes themselves move over the component’s surface.

 

Applications

  • Defectoscope-LX is ideally suited for detection of fine surface cracks on precision components such as those used in automotive industries, aerospace, defence or other demanding applications.
  • Typically used for automobile components, the system can detect flaws as fine as 50 microns on polished surfaces.
  • Complete automation support is provided along with several kinds of custom-built mechanisms for scanning and sorting to maximize productivity.

 

Features

  • Can detect axial as well as circumferential* defects
  • Multi-channel capability for testing complex parts
  • Up to 32 probes for scanning various surfaces
  • Capable of end-area inspection in OCTG pipes
  • Variable test frequency
  • Multiple display templates
  • Ethernet connectivity with a remote computer
  • E-mailed reports at scheduled intervals
  • Independent High-pass and Low-pass filters
  • Customized mechanisms for test automation
  • Four thresholds including sector gate
  • Three evaluation modes
  • No magnetization or demagnetization required
  • 100% quality inspection

Technical Data

Frequency Range          30 KHz to 3 MHz       
Max probes / channels  32
Max filter sets                 32            
Operating System          Windows 32 bit     
Connectivity                  
Intranet / internet over Ethernet                 
Data storage                   Hard disk, USB flash drive              
Signal Gain                     20 dB to 80 dB in steps of 0.1 dB                
Phase                              0 deg to 359 deg in steps of 1 deg           
Thresholds                     Upper, Lower, Third: 10% to 100%
                                         Sector: 20° to 80°
Evaluation modes          Amplitude, Phase Sensitive, Sector
Filters                              High Pass: 10 Hz to 2550 Hz 
                                         Low Pass: 20 Hz to 5100 Hz        
Automation                     Low Pass: 20 Hz to 5100 Hz 

Features

  • Can detect axial as well as circumferential* defects
  • Multi-channel capability for testing complex parts
  • Up to 32 probes for scanning various surfaces
  • Capable of end-area inspection in OCTG pipes
  • Variable test frequency
  • Multiple display templates
  • Ethernet connectivity with a remote computer
  • E-mailed reports at scheduled intervals
  • Independent High-pass and Low-pass filters
  • Customized mechanisms for test automation
  • Four thresholds including sector gate
  • Three evaluation modes
  • No magnetization or demagnetization required
  • 100% quality inspection

Technical Data

Frequency Range: 30 KHz to 3 MHz       
Max probes / channels: 32
Max filter sets: 32            
Operating System: Windows 32 bit     
Connectivity:
Intranet / internet over Ethernet     
Data storage: Hard disk, USB flash drive              
Signal Gain: 20 dB to 80 dB in steps of 0.1 dB                
Phase: 0 deg to 359 deg in steps of 1 deg           
Thresholds: Upper, Lower Ι Third: 10% to 100% Ι Sector: 20° to 80°
Evaluation modes: Amplitude, Phase Sensitive, Sector
Filters: High Pass: 10 Hz to 2550 Hz Ι Low Pass: 20 Hz to 5100 Hz        
Automation: Low Pass: 20 Hz to 5100 Hz 

A Defectoscope probe scans the surface of a rotating component
Operating principle
Automatic scanning/sorting mechanism for Ball pins, used with Defectoscope test system
Ballpin scanner and sorter